Test & Measurement

AFM Boosts Performance

April 18, 2014

Embarking as the latest member of the MFP-3D family of atomic force microscopes (AFMs), the MFP-3D Infinity boasts performance improvements, new nano-mechanical measurement capabilities, and features that make it simple to get started with tapping mode imaging. It features a 90-µm stage and control electronics located close to the AFM for fast, low noise performance.

MFP-3D Infinity Atomic Force Microscope (AFM)

Flexible signal switching and programmable logic enable future expansion options. The new head and scanner improve sensor noise to less than 35 pm in Z and less than 150pm in X&Y. Pixel rate is 300 Hz. For more details and specs, download the brochure at http://www.asylumresearch.com/Products/MFP3DInfinity/MFP-3D-Infinity-AFM.pdf

Oxford Instruments Asylum Research
Santa Barbara, CA

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