Microsanj Introduces Transient Thermoreflectance Thermal Image Analyzer

March 10, 2014

Instrument provides economical solution for sub-micron semiconductor thermal analysis

Sanata Clara, CA -- Microsanj announces the availability of the newest addition to the NT100-Nanotherm Series thermal image analyzers. The NT110A is a bench-top system that provides transient capability with 5 microsecond time resolution. Both the NT100A, for steady state thermal imaging, and the NT110A, for transient thermal imaging, have a spatial resolution less than 1 micron and a relative temperature resolution of 1 degree C. The ability to analyze and develop an understanding of the thermal behavior of microelectronic and optoelectronic devices is essential for design optimization and ensuring device performance and long term reliability. Adding the capability for transient thermal imaging enables the analysis of time-dependent thermal events; information especially important for characterizing the thermal performance of complex logic and high power devices.

"Shrinking dimensions and increasing device complexities create significant obstacles to fully understanding the thermal behavior of today's microelectronic devices. The NT100A and NT110A Thermal Analyzers, based on thermoreflectance, provide the most economical thermal imaging solutions available with the performance and resolution required for non-invasive thermal analysis of these advanced devices," said Dr. Mo Shakouri, Microsanj CEO. "We are targeting these products for general purpose in-situ thermal imaging for circuit design verification, manufacturing process control, reliability assessment, and device failure analysis."

For detailed specifications, pricing, and availability, contact Microsanj at info@microsanj.com and visit http://www.microsanj.com

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