Sensors Author

Eric Kirleis

Sionex Corp.

Eric Kirleis can be reached at Sionex Corp., Bedford, MA; 781-457-5416.

On-Site Trace Chemical Detection, Part 2: IMS and DMS Working Together   February 1, 2008
By: Eric Kirleis

Last month we discussed how IMS and DMS are used for trace chemical detection. Now we consider how the two technologies can be used in tandem to achieve greater selectivity and sensitivity and fewer false positives.

On-Site Trace Chemical Detection, Part 1: Understanding Ion Mobility and Differential Ion Mobility Spectroscopy   January 1, 2008
By: Eric Kirleis

The first installment of this two-part series discusses ion mobility spectroscopy (IMS), the leading contender for fast and reliable detection of trace chemicals, and differential ion mobility spectroscopy (DMS), a related technology that provides faster, smaller and more sensitive sensors capable...more >>

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