Machine Vision

SWIR Detector from Xenics

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February 26, 2012

Xenics, Leuven, Belgium, offers the XFPA-1.7-640-LN2 low-noise SWIR detector for demanding low-signal-level measurements in semiconductor inspection and fault localization. The liquid-nitrogen-cooled detector was developed for R&D spectroscopy and photon emission in the semiconductor failure analysis industry, high-resolution spectroscopy, and low-light-level SWIR and VisNIR imaging. The detector is based on source-follower detector read-out technology and offers a 640 by 512 pixel resolution with a 20 µ pixel pitch for long integration times. Liquid nitrogen cooling at 77 K lets the detector achieve noise <20 e- and dark current <5 e-/s/pixel.


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