Parametric Tester from Keithley Instruments
Keithley Instruments Inc.
September 19, 2007
Keithley Instruments Inc., Cleveland, OH, adds Models 2635 and 2636 to its Series 2600 SourceMeter instruments that allow you to perform semiconductor parametric analysis and testing at resolutions as fine as 1 fA. Both devices provide DC and pulse testing from femtoamps and microvolts up to 200 V/1.5 A and operate with or without a PC. Each includes a PC-like microprocessor for programming and independent execution of test programs and can operate as a source-measure unit, DMM, bias source, low-frequency pulse generator, and arbitrary waveform generator. The single-channel 2635 and dual-channel 2636 can be integrated without a host mainframe.
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