Vision & Optical

Nanopositioning System Handles Metrology And Microscopy Chores

Nanopositioning System Handles Metrology And Microscopy Chores

March 5, 2014

Tailored for imaging and fast focusing applications, the P-736.ZR large-aperture, flexure-guided piezo nanopositioning stages can quickly switch between focus tracking and closed-loop positioning. They also accommodate fast focus and freeze applications. Mountable on inverted microscopes from Nikon and Olympus, the large aperture accommodates accessories such as well plates and incubation chambers. More information is available at and a datasheet is at

Physik Instrumente (PI) LP
Auburn, MA


CompanyPhysik Instrumente
CountryUnited States (USA)


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