High-Sensitivity NIR Cameras from Baumer
December 12, 2010
TXG14NIR cameras from Baumer Group, Southington, CT, have enhanced sensitivity in the NIR, enabling the cameras to perform automatic inspection of wafers for solar cells. Measuring electroluminescence using NIR imaging cameras lets you detect fractures as well as failures in the crystal structure, providing information on the integrity and effectiveness of each wafer prior to the next processing step. The cameras provide high-resolution images with 1392 by 1040 pixels.
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