DA & Control

The New R&S RTE Oscilloscopes from Rohde & Schwarz: Ease of Use Combined with Powerful Analysis Tools

February 27, 2014

MUNICH, Germany -- R&S RTE digital oscilloscopes offer fast and reliable solutions for everyday T&M tasks such as embedded design development, power electronics analysis and general debugging. Users benefit from features such as high sampling and acquisition rates and good signal fidelity. A comprehensive set of measurement and analysis tools deliver fast results and the high-resolution touchscreen makes the R&S RTE very easy to use.

The new R&S RTE from Rohde & Schwarz is available with bandwidths from 200 MHz to 1 GHz. An acquisition rate of more than one million waveforms per second helps users find signal faults quickly. The scope's highly accurate digital trigger system with virtually no trigger jitter delivers highly precise results. The single-core A/D converter with more than seven effective bits (ENOB) almost completely eliminates signal distortion. With a sampling rate of 5 Gsample per second and a maximum memory depth of 50 Msample per channel, the R&S RTE can accurately record the long signal sequences required when analyzing the data content of serial protocols such as I2C and CAN.

Users performing complex tasks will especially appreciate the high measurement speed of the R&S RTE. Mask tests, for example, quickly return statistically conclusive results. The highly responsive, spectrum-analyzer-like FFT reliably detects even sporadic signals, making the R&S RTE ideal for EMI debugging during product development.

Thanks to the high-resolution 10.4" XGA touchscreen, users can intuitively perform their daily T&M tasks. For instance, they only have to swipe the screen to access saved instrument setups. And they can simply "drag & drop" waveforms to arrange them on the screen.

For more information, visit http://www.scope-of-the-art.com/ad/press/rte and http://www.rohde-schwarz.com

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