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R&D

News and information on new sensor technologies and other sensor-related R&D efforts.


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GE Brings Digital Solutions to Nondestructive Testing (NDT) Industry   April 29, 2016

Mentor UT Improves Productivity with the Power of Apps and Live Wireless CollaborationMore>>

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Anritsu Adds Tools to VNA Families that Improve Signal Integrity Testing Capability for Verification of High-speed Designs   April 28, 2016

VectorStar and ShockLine Series Offer Engineers Enhanced Capabilities to Meet Challenges Associated with Faster Data Rates and More Extensive Circuits ̶ More>>

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Revolutionize high-performance power conversion with TI's 600-V GaN FET power stage   April 25, 2016

The first publicly sampled, TI-manufactured integrated high-voltage GaN FET and driver solution enables twice the power density and half the power loss. More>>

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TE Connectivity, ifm, SAP and the OPC Foundation to Present Test Platform for Transmitting and Evaluating Sensor Data in IT Systems   April 25, 2016

TE Connectivity ifm, SAP and the OPC Foundation develop a test bed that shows how all sensor data can be transmitted from machines to an IT system and evaluated there. More>>

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New Calibration Fixture for All Models of Siborg's LCR-meters Including LCR-Reader   April 25, 2016

Siborg has released a new calibration unit that allows all of its LCR-meters to be periodically calibrated, and offers NIST Traceable Calibration Certificates for the LCR-Reader More>>

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Keysight Technologies Introduces Enhanced FFT Application on 12-Bit DAQ PCIe Card   April 21, 2016

Fast Fourier transform (FFT) application option enables improved fixed point arithmetic that eliminates deteriorating effects for applications in astronomy, physics, and environmental measurements. More>>

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Design Contest Calls Upon Imagineers to "Create the Future"   April 15, 2016

Engineering Innovation Award: $20,000 Grand Prize More>>

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IXXAT Software Enables Time Synchronization In Nanosecond Range   April 15, 2016

First commercially available software package for highly accurate time synchronization of AVB and TSN networks. More>>

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Teledyne LeCroy Acquires Quantum Data   April 15, 2016

Teledyne LeCroy will expand protocol solutions offerings into video protocols including HDMI and SDI with the acquisition. More>>

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Fluke 279 FC Thermal Multimeter integrates two test tools in one   April 8, 2016

The 279 FC allows technicians to quickly and safely check for hot spots in fuses, wires, insulators, connectors, splices, and switches with the imager and then troubleshoot and analyze issues with the DMM. More>>





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